Michael Eric Gehm

Gehm

Professor of Electrical and Computer Engineering

Michael Gehm received a B.S. in Mechanical Engineering from Washington University in St. Louis in 1992. He earned his A.M. and Ph.D. degrees in Physics from Duke University in 1998 and 2003, respectively. From 2003–2005, he was a Research Associate in ECE at Duke, followed by a year as an Assistant Research Professor. In 2007 he was appointed an Assistant Professor of ECE and was jointly appointed an Assistant Professor of Optical Sciences in 2009. He was promoted to Associate Professor of ECE and Optical Sciences in 2013 before returning to Duke as an Associate Professor of ECE later that year. He added a secondary appointment in Physics in 2021. In 2022, he was promoted to Professor of ECE and Physics.

His current research interests are primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures.

 He is a Fellow of both Optica (formerly, OSA) and SPIE.

Appointments and Affiliations

  • Professor of Electrical and Computer Engineering
  • Associate Professor of Physics

Contact Information

  • Office Location: 3463 Ciemas, Fitzpatrick Center, Durham, NC 27708
  • Office Phone: +1 919 660 5544
  • Email Address: michael.gehm@duke.edu

Education

  • Ph.D. Duke University, 2003
  • M.S. Duke University, 1998
  • B.S. Washington University in St. Louis, 1992

Research Interests

Primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures

Awards, Honors, and Distinctions

  • Fellow. SPIE. 2022
  • Fellow. Optica (formerly, OSA). 2020

Courses Taught

  • ECE 899: Special Readings in Electrical Engineering
  • ECE 542: Holography and Coherent Imaging
  • ECE 270L9: Fields and Waves: Fundamentals of Information Propagation (Lab)
  • ECE 270DL: Fields and Waves: Fundamentals of Information Propagation

In the News

Representative Publications

  • DiDona, S; Russell, Z; Glass, J; Gehm, M, A high resolution miniature electron energy spectrometer, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol 1064 (2024) [10.1016/j.nima.2024.169391] [abs].
  • Aloui, T; Vyas, R; Francini, S; Serpa, RB; Horvath, KL; Keogh, J; Parker, CB; Denton, MB; Glass, JT; Gehm, ME; Amsden, JJ, Spectral Reconstruction Improvement in a Cycloidal Coded-Aperture Mass Spectrometer., Journal of the American Society for Mass Spectrometry, vol 35 no. 5 (2024), pp. 855-861 [10.1021/jasms.3c00421] [abs].
  • Guo, S; Boyarsky, M; Vigil, SA; Yu, Y; Moreno-Hernandez, IA; Gehm, ME; Wiley, BJ, Toward One-Way Smoke: Synthesis of Copper-Based Microclubs with Asymmetric Scattering and Absorption, Advanced Functional Materials (2024) [10.1002/adfm.202315289] [abs].
  • Ruiz, SD; Martinez, M; Gehm, ME, Asymmetric Illumination X-Ray Differential Phase Contrast Imaging, Proceedings of SPIE - The International Society for Optical Engineering, vol 12531 (2023) [10.1117/12.2663925] [abs].
  • Hurlock, AX; Koh, T; Martinez, M; Gehm, ME, Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI), Proceedings of SPIE - The International Society for Optical Engineering, vol 12531 (2023) [10.1117/12.2663798] [abs].