Joel Alter Greenberg
Associate Research Professor in the Department of Electrical and Computer Engineering
Dr. Greenberg's research is in the area of computational imaging with a focus on physics-based modeling and system-level design from fundamental science through algorithm implementation. His work spans the electromagnetic spectrum, with a focus on X-ray and visible imaging and detection systems for security and medical applications.
Appointments and Affiliations
- Associate Research Professor in the Department of Electrical and Computer Engineering
- Office Location: Box 90291, Dept of Ece, Durham, NC 27708
- Office Phone: (919) 660-0183
- Email Address: firstname.lastname@example.org
- Ph.D. Duke University, 2012
Computational sensing with a focus on novel, physics-based measurement techniques for practical applications. Primarily focused in the electromagnetic/optical spectrum ranging from ELF through visible and hard X-rays, with applications to security, non-destructive testing, and medical imaging. Investigations range from basic science (e.g. fundamental studies in material science, optics, and information science) to applied and transitional work (e.g. design and implementation of architectures at the system level targeted at particular, real-world problems)
- ECE 493: Projects in Electrical and Computer Engineering
In the News
- X-ray Scanner Spots Cancers and Analyzes Drugs in Minutes (Jun 9, 2021 | Pratt School of Engineering)
- A Speedier and More Accurate Future for Airport Security Screening (Feb 24, 2020 | Pratt School of Engineering)
- Duke researchers developing the next generation of airport scanners (Dec 13, 2018 | Triangle Business Journal)
- Duke to Lead $5.83 Million DHS Project to Reinvent Airport Screening (Dec 10, 2018 | Pratt School of Engineering)
- Duke to Lead $5.83 Million DHS Project to Reinvent Airport Screening (Dec 7, 2018)
- Decoding Multiple Frames from a Single, Scattered Exposure (Sep 27, 2018)
- Gude, Z; Kapadia, AJ; Greenberg, JA, 3D x-ray diffraction imaging of optically thin samples, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 12104 (2022) [10.1117/12.2618938] [abs].
- Ruiz, SD; Gude, ZW; Hurlock, AX; Ferguson, K; Miller, C; Carpenter, JH; Greenberg, JA; Gehm, ME, Characterization of photon counting detectors for x-ray diffraction (XRD) applications, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 12104 (2022) [10.1117/12.2618954] [abs].
- Hurlock, AX; Ruiz, SD; Carpenter, JH; Greenberg, JA; Gehm, ME, Spectrally responsive edge-illumination (SREI) x-ray phase contrast imaging (XPCI), Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 12104 (2022) [10.1117/12.2618827] [abs].
- Stryker, S; Kapadia, AJ; Greenberg, JA, Application of machine learning classifiers to X-ray diffraction imaging with medically relevant phantoms., Medical Physics, vol 49 no. 1 (2022), pp. 532-546 [10.1002/mp.15366] [abs].
- Stryker, S; Greenberg, JA; McCall, SJ; Kapadia, AJ, X-ray fan beam coded aperture transmission and diffraction imaging for fast material analysis., Scientific Reports, vol 11 no. 1 (2021) [10.1038/s41598-021-90163-0] [abs].